Dunn, J. C. (2018). How to fit models of recognition memory data using maximum likelihood. Editorial Bonaventuriana.
Citación Chicago StyleDunn, John C. How to Fit Models of Recognition Memory Data Using Maximum Likelihood. Editorial Bonaventuriana, 2018.
Cita MLADunn, John C. How to Fit Models of Recognition Memory Data Using Maximum Likelihood. Editorial Bonaventuriana, 2018.