Cita APA

Volkmann, U. (2017). High Resolution Ellipsometric Study of An N-Alkane Film, Dotriacontane, Adsorbed on a Sio2 Surface.

Citación Chicago Style

Volkmann, Ulrich. High Resolution Ellipsometric Study of An N-Alkane Film, Dotriacontane, Adsorbed On a Sio2 Surface. 2017.

Cita MLA

Volkmann, Ulrich. High Resolution Ellipsometric Study of An N-Alkane Film, Dotriacontane, Adsorbed On a Sio2 Surface. 2017.

Precaución: Estas citas no son 100% exactas.